Title :
High Frequency Circuit Simulator based on finite integration technology
Author :
Zhu, Xiaofang ; Yang, Zhonghai ; Li, Bin ; Li, JiangQing ; Xu, Li ; Huang, Tao ; Hu, Quan ; Hu, Yulu ; Ma, JunJian ; Peng, WeiFeng ; Liao, Li ; Xiao, Li ; He, GuoXian
Author_Institution :
Sch. of Phys. Electron., Univ. of Electron. Sci. & Technol. of China, Chengdu
Abstract :
This paper provides the design and realization of high frequency circuit simulator (HFCS) which is based on the Finite Integration Technology. For vilification, the cold-test characteristics of two actual helical slow wave structures have been calculated and the results were found to be consistent with those of MAFIA simulation with same mesh density.
Keywords :
circuit simulation; MAFIA simulation; finite integration technology; high frequency circuit simulator; Attenuation; Circuit simulation; Circuit testing; Convergence; Coupling circuits; Frequency; Hybrid fiber coaxial cables; Impedance; Laboratories; Microwave circuits; cold test characteristics; finite integration technology; helical slow wave structure; high frequency circuit simulator;
Conference_Titel :
Vacuum Electronics Conference, 2008. IVEC 2008. IEEE International
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4244-1715-5
DOI :
10.1109/IVELEC.2008.4556344
