DocumentCode :
2004032
Title :
Epoxy/silica nanocomposite dielectrics used for vacuum pressure impregnating application
Author :
Jiang, Pingkai ; Zheng, Yun ; Huang, Xingyi ; Liu, Fei
Author_Institution :
Dept. of Polymer Sci. & Eng., Shanghai Jiao Tong Univ., Shanghai, China
fYear :
2010
fDate :
4-9 July 2010
Firstpage :
1
Lastpage :
4
Abstract :
This paper evaluated the influences of silica nanoparticles on the dielectric properties, mechanical performances and glass transformation behaviors of epoxy resin by analyzing the temperature dependence of dc conduction and dielectric loss, impact test results and dynamic mechanical data, respectively. The particular attention was given to the correlation between the glass transformation behaviors, the mechanical performances and the dielectric behaviors. The dispersion of silica nanoparticles and the morphology of the nanocomposite samples were investigated by means of transmission electronic microscopy (TEM) and field emission scanning electronic microscopy (FE-SEM). Our results showed that, though silica nanoparticles could effectively increase the toughness of epoxy resin when the silica content is within 3.0 wt%, the dielectric loss and the dc conductivity increase with the increasing silica content. The understanding of the structure-property relationship in epoxy/silica nanocomposites might enable us to choose proper surface treatment approaches of the nanofiller to gain enhanced properties.
Keywords :
dielectric materials; electrical conductivity; epoxy insulation; nanocomposites; nanoparticles; resins; scanning electron microscopy; transmission electron microscopy; FE-SEM; TEM; dielectric mechanical behaviors; electrical conductivity; epoxy resin; field emission scanning electronic microscopy; glass transformation behaviors; nanocomposite dielectric properties; silica nanoparticles; surface treatment; transmission electronic microscopy; vacuum pressure impregnating application; Dielectric losses; Epoxy resins; Nanoparticles; Silicon compounds; Temperature; Temperature measurement; dielectric behavior; epoxy resin; glass-transition temperature; silica particle;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid Dielectrics (ICSD), 2010 10th IEEE International Conference on
Conference_Location :
Potsdam
Print_ISBN :
978-1-4244-7945-0
Electronic_ISBN :
978-1-4244-7943-6
Type :
conf
DOI :
10.1109/ICSD.2010.5568091
Filename :
5568091
Link To Document :
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