Title :
Pulsed mixed n, γ radiation fields for electronic testing
Author :
Vie, Michel ; Baboulet, Jean Pierre ; Lapeyre, Pascal ; Ramisse, Daniel ; Nurdin, Guy ; Becret, Claude ; Jaureguy, Jean Claude
Author_Institution :
DGA, Centre d´´Etudes de Gramat, France
Abstract :
For combined n, γ TREE testing we have modified the CALIBAN Fast Burst Reactor Field with CdO/Epoxy converters to cover the range [1011-1012] n.cm-2(1 MeV Si), [107 -108] cGy(Si).s-1. Activation and fission σ Φ¯, 1 MeV(Si) fluences, neutron spectra, total exposures and dose rates were predicted with good agreement by n, γ photon transport codes
Keywords :
gamma-ray effects; neutron effects; semiconductor device testing; CALIBAN Fast Burst Reactor Field; activation fluences; combined n, γ TREE testing; dose rates; fission fluences; gamma radiation fields; neutron radiation fields; neutron spectra; photon transport codes; pulsed mixed radiation; total exposures; transient radiation effects on electronics; Benchmark testing; Cadmium compounds; Converters; Detectors; Electronic equipment testing; Inductors; Light scattering; Neutrons; Silicon; US Department of Transportation;
Conference_Titel :
Radiation and its Effects on Components and Systems, 1993.,RADECS 93., Second European Conference on
Conference_Location :
St. Malo
Print_ISBN :
0-7803-1793-9
DOI :
10.1109/RADECS.1993.316555
