DocumentCode :
2004315
Title :
Prediction Of ESD Protection Levels Devices In Thin Film SOI And Novel Protection Devices in thin film SOI Technology
Author :
Raha, Prasun ; Smith, Jeremy C. ; Miller, James W. ; Rosenbaum, Elyse
Author_Institution :
308 W. Main St., University Of Illinois, Urbana, Il-61801
fYear :
1997
fDate :
25-25 Sept. 1997
Firstpage :
356
Lastpage :
365
Keywords :
Biological system modeling; Circuits; Electrostatic discharge; MOSFETs; Protection; Pulse measurements; Stress; Thermal conductivity; Thin film devices; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium,1997. Proceedings
Conference_Location :
Orlando, FL, USA
Print_ISBN :
1-878303-69-4
Type :
conf
DOI :
10.1109/EOSESD.1997.634263
Filename :
634263
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2004315
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