• DocumentCode
    2004509
  • Title

    S-Parameters Measurement of Chip GaAs FETs up TO 22 GHz using the TRL Calibration Technique

  • Author

    Pradell, L. ; Artal, E. ; Sabater, C.

  • Author_Institution
    E.T.S.E. Telecomunicació, Dept. T.S.C. - A.M.R. Group, Ap. 30002, 08080 - Barcelna - Spain
  • fYear
    1989
  • fDate
    4-7 Sept. 1989
  • Firstpage
    576
  • Lastpage
    581
  • Abstract
    In this paper, the design of a Microstrip Test Fixture for TRL calibration is described. Experimental results for S-parameters measurement of a GaAs FET chip in the 3-22 GHz frequency range are presented. Repeatability of connections and measurements is discussed and experimental results are also presented.
  • Keywords
    Calibration; Connectors; FETs; Fixtures; Gallium arsenide; Microstrip; Scattering parameters; Semiconductor device measurement; Testing; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 1989. 19th European
  • Conference_Location
    London, UK
  • Type

    conf

  • DOI
    10.1109/EUMA.1989.334030
  • Filename
    4132742
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2004509