DocumentCode :
2004509
Title :
S-Parameters Measurement of Chip GaAs FETs up TO 22 GHz using the TRL Calibration Technique
Author :
Pradell, L. ; Artal, E. ; Sabater, C.
Author_Institution :
E.T.S.E. Telecomunicació, Dept. T.S.C. - A.M.R. Group, Ap. 30002, 08080 - Barcelna - Spain
fYear :
1989
fDate :
4-7 Sept. 1989
Firstpage :
576
Lastpage :
581
Abstract :
In this paper, the design of a Microstrip Test Fixture for TRL calibration is described. Experimental results for S-parameters measurement of a GaAs FET chip in the 3-22 GHz frequency range are presented. Repeatability of connections and measurements is discussed and experimental results are also presented.
Keywords :
Calibration; Connectors; FETs; Fixtures; Gallium arsenide; Microstrip; Scattering parameters; Semiconductor device measurement; Testing; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 1989. 19th European
Conference_Location :
London, UK
Type :
conf
DOI :
10.1109/EUMA.1989.334030
Filename :
4132742
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2004509
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