Automatic Large-Signal Measurement System for Nonlinear Device Modeling and Model Verification

A new generalized large-signal measurement approach using an automatic reflection and transmission measurement system operating in stepped CW mode is presented. Combining network analyzer and sampling oscilloscope receiver features, the system measures the frequency dependent fundamental and higher harmonic amplitude and phase response of nonlinear one-port and two-port devices under sinusoidal excitation. An error model considering the tracking errors of the different measurement receivers and a corresponding calibration procedure are derived. GaAs MESFET measurement examples are given and preliminary analytic results on large-signal modeling are discussed.