Title :
Investigation of secondary electron emission suppression for TWT multistage depressed collectors
Author :
Ding, Ming Q. ; Huang, Mingguang ; Feng, Jinjun ; Bai, Guodong ; Yan, Tiechang
Author_Institution :
Beijing Vacuum Electron. Res. Inst., Beijing
Abstract :
We have built an ion treatment system for TWT multistage depressed collectors (MDCs), and investigated the process for secondary electron emission (SEE) suppression. It is found that SEE ratio for oxygen-free high-conductive copper (OFHC) plates is closely related to deposition rate of Mo and surface texture. With the optimized process, SEE ratio has been reduced to a half of the untreated (OFHC).
Keywords :
copper; ion beam assisted deposition; molybdenum; secondary electron emission; surface texture; travelling wave tubes; Cu; Mo; SEE ratio; TWT; ion treatment system; molybdenum deposition rate; multistage depressed collectors; oxygen-free high-conductive copper plates; secondary electron emission suppression; surface texture; Atomic layer deposition; Copper; Electron beams; Electron emission; Ion beams; Pulsed power supplies; Surface texture; Surface treatment; Teeth; Vacuum systems;
Conference_Titel :
Vacuum Electronics Conference, 2008. IVEC 2008. IEEE International
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4244-1715-5
DOI :
10.1109/IVELEC.2008.4556372
