Title :
Highly Reliable 4W Continuous Wave Laser Diodes With A 370 Micron Aperture
Author :
Wolak, Edmund ; Sakamoto, Masamichi ; Endriz, John ; Scifres, Don
Author_Institution :
Spectra Diode Laboratories
Keywords :
Apertures; Brightness; Degradation; Diode lasers; Heat sinks; Inorganic materials; Life testing; Optical sensors; Temperature measurement; Thermal resistance;
Conference_Titel :
LEOS '92, Conference Proceedings. IEEE Lasers and Electro-Optics Society, 1992 Annual Meeting
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-0526-4
DOI :
10.1109/LEOS.1992.693901