• DocumentCode
    2004619
  • Title

    Highly Reliable 4W Continuous Wave Laser Diodes With A 370 Micron Aperture

  • Author

    Wolak, Edmund ; Sakamoto, Masamichi ; Endriz, John ; Scifres, Don

  • Author_Institution
    Spectra Diode Laboratories
  • fYear
    1992
  • fDate
    16-19 Nov. 1992
  • Firstpage
    175
  • Lastpage
    176
  • Keywords
    Apertures; Brightness; Degradation; Diode lasers; Heat sinks; Inorganic materials; Life testing; Optical sensors; Temperature measurement; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    LEOS '92, Conference Proceedings. IEEE Lasers and Electro-Optics Society, 1992 Annual Meeting
  • Conference_Location
    Boston, MA, USA
  • Print_ISBN
    0-7803-0526-4
  • Type

    conf

  • DOI
    10.1109/LEOS.1992.693901
  • Filename
    693901