DocumentCode
2004667
Title
Sliding FFT for analyzing the abrupt fault caused by SET
Author
Guocai, Liu
Author_Institution
Microgravity Dept., Chinese Acad. of Sci., Beijing, China
fYear
2011
fDate
24-25 May 2011
Firstpage
1
Lastpage
4
Abstract
Taking the response data caused by the single event transient effects (SET) simulated by laser test facility and based on the optocoupler for example, this paper adapts sliding FFT method to analyze the response data. Analytical results indicate the method could quickly and correctly implement fault location. Therefore, more time could be saved to take necessary protective measures.
Keywords
fast Fourier transforms; fault diagnosis; radiation hardening (electronics); space vehicle electronics; SET; abrupt fault; laser test facility; optocoupler; protective measure; single event transient effect; sliding FFT; Atmospheric measurements; Lasers; Particle measurements; Pulse measurements; Time domain analysis; Time varying systems; Vehicle dynamics; fault location; paroxysmal fault; prognostic and health management system; single event transient;
fLanguage
English
Publisher
ieee
Conference_Titel
Prognostics and System Health Management Conference (PHM-Shenzhen), 2011
Conference_Location
Shenzhen
Print_ISBN
978-1-4244-7951-1
Electronic_ISBN
978-1-4244-7949-8
Type
conf
DOI
10.1109/PHM.2011.5939467
Filename
5939467
Link To Document