Title :
Sliding FFT for analyzing the abrupt fault caused by SET
Author_Institution :
Microgravity Dept., Chinese Acad. of Sci., Beijing, China
Abstract :
Taking the response data caused by the single event transient effects (SET) simulated by laser test facility and based on the optocoupler for example, this paper adapts sliding FFT method to analyze the response data. Analytical results indicate the method could quickly and correctly implement fault location. Therefore, more time could be saved to take necessary protective measures.
Keywords :
fast Fourier transforms; fault diagnosis; radiation hardening (electronics); space vehicle electronics; SET; abrupt fault; laser test facility; optocoupler; protective measure; single event transient effect; sliding FFT; Atmospheric measurements; Lasers; Particle measurements; Pulse measurements; Time domain analysis; Time varying systems; Vehicle dynamics; fault location; paroxysmal fault; prognostic and health management system; single event transient;
Conference_Titel :
Prognostics and System Health Management Conference (PHM-Shenzhen), 2011
Conference_Location :
Shenzhen
Print_ISBN :
978-1-4244-7951-1
Electronic_ISBN :
978-1-4244-7949-8
DOI :
10.1109/PHM.2011.5939467
