DocumentCode :
2004712
Title :
Piezoelectrets from sandwiched porous polytetrafluoroethylene films with different porosity
Author :
Zhukov, Sergey ; von Seggern, Heinz
Author_Institution :
Inst. of Mater. Sci., Tech. Univ. Darmstadt, Darmstadt, Germany
fYear :
2010
fDate :
4-9 July 2010
Firstpage :
1
Lastpage :
4
Abstract :
The present study deals with the investigation of the poling behavior of individual and sandwiched porous films of polyfluoroethylene (ePTFE) having different porosities ranging from 70% to 98%. In the stand alone porous films (90-98%) the maximum breakdown electric field strength EPB follows Paschen´s law for air. Therefore those ePTFE films can be considered as a single large air pore with respect to breakdown phenomenon. In the sandwich arrangement the same film exhibits a 2 times higher EPB value. On lowering porosity up to 70% the EPB value considerably increases. The model proposed in earlier work had no parameter for introducing porosity, but nevertheless well describes the changes of sandwich poling and switching behaviour if the experimental value for EPB on porosity is taken into account. The model and the gained insight into the poling process can also be utilized to further optimization of the sandwich structure as an electromechanically active device.
Keywords :
dielectric polarisation; electrets; electric breakdown; piezoelectricity; polymer films; porosity; switching; Paschen law; breakdown electric field strength; piezoelectrets; poling processing; porosity; sandwich structure; sandwiched porous polytetrafluoroethylene films; switching behaviour; Corona; Electric potential; Films; Hysteresis; Integrated circuits; Surface charging; Paschen breakdown; ferroelectrets; piezoelectric coefficients; porous ePTFE film;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid Dielectrics (ICSD), 2010 10th IEEE International Conference on
Conference_Location :
Potsdam
Print_ISBN :
978-1-4244-7945-0
Electronic_ISBN :
978-1-4244-7943-6
Type :
conf
DOI :
10.1109/ICSD.2010.5568127
Filename :
5568127
Link To Document :
بازگشت