• DocumentCode
    2004712
  • Title

    Piezoelectrets from sandwiched porous polytetrafluoroethylene films with different porosity

  • Author

    Zhukov, Sergey ; von Seggern, Heinz

  • Author_Institution
    Inst. of Mater. Sci., Tech. Univ. Darmstadt, Darmstadt, Germany
  • fYear
    2010
  • fDate
    4-9 July 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The present study deals with the investigation of the poling behavior of individual and sandwiched porous films of polyfluoroethylene (ePTFE) having different porosities ranging from 70% to 98%. In the stand alone porous films (90-98%) the maximum breakdown electric field strength EPB follows Paschen´s law for air. Therefore those ePTFE films can be considered as a single large air pore with respect to breakdown phenomenon. In the sandwich arrangement the same film exhibits a 2 times higher EPB value. On lowering porosity up to 70% the EPB value considerably increases. The model proposed in earlier work had no parameter for introducing porosity, but nevertheless well describes the changes of sandwich poling and switching behaviour if the experimental value for EPB on porosity is taken into account. The model and the gained insight into the poling process can also be utilized to further optimization of the sandwich structure as an electromechanically active device.
  • Keywords
    dielectric polarisation; electrets; electric breakdown; piezoelectricity; polymer films; porosity; switching; Paschen law; breakdown electric field strength; piezoelectrets; poling processing; porosity; sandwich structure; sandwiched porous polytetrafluoroethylene films; switching behaviour; Corona; Electric potential; Films; Hysteresis; Integrated circuits; Surface charging; Paschen breakdown; ferroelectrets; piezoelectric coefficients; porous ePTFE film;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid Dielectrics (ICSD), 2010 10th IEEE International Conference on
  • Conference_Location
    Potsdam
  • Print_ISBN
    978-1-4244-7945-0
  • Electronic_ISBN
    978-1-4244-7943-6
  • Type

    conf

  • DOI
    10.1109/ICSD.2010.5568127
  • Filename
    5568127