DocumentCode :
2004766
Title :
Decay-time Use With Characterization Magnetoresistive Of ESD Materials For Recording Heads
Author :
Lam, Chung F. ; Chang, Caleb
Author_Institution :
Read-rite Corporation, 4100 Osgood Road, Fremone Ca 94538, U.s.a.
fYear :
1997
fDate :
25-25 Sept. 1997
Firstpage :
373
Lastpage :
381
Keywords :
Conductivity; Electrostatic discharge; Equations; Magnetic heads; Magnetic materials; Magnetoresistance; Polymers; Semiconductor materials; Surface resistance; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium,1997. Proceedings
Conference_Location :
Orlando, FL, USA
Print_ISBN :
1-878303-69-4
Type :
conf
DOI :
10.1109/EOSESD.1997.634265
Filename :
634265
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2004766
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