Title :
Optimal puncturing distributions for rate-compatible low-density parity-check codes
Author :
Ha, Jeoiigseok ; McLaughlin, Steven W.
Author_Institution :
School of Electrical and Computer Engineering, Georgia lustitute of Technology
fDate :
29 June-4 July 2003
Keywords :
Binary phase shift keying; Bipartite graph; Decoding; Gaussian approximation; Gaussian distribution; Parity check codes; Process design; Signal design; Signal processing;
Conference_Titel :
Information Theory, 2003. Proceedings. IEEE International Symposium on
Print_ISBN :
0-7803-7728-1
DOI :
10.1109/ISIT.2003.1228247