DocumentCode :
2004972
Title :
Field-induced Breakdown ESD Damage Of Magnetoresistive Recording Heads
Author :
Wallash, Albert ; Honda, Masamitsu
Author_Institution :
Quantum Corporation, 500 Mccarthy Boulevard, Milpitas, Ca 95035
fYear :
1997
fDate :
25-25 Sept. 1997
Firstpage :
382
Lastpage :
385
Keywords :
Biological system modeling; Electric breakdown; Electrostatic discharge; Failure analysis; Magnetic field measurement; Magnetic heads; Magnetoresistance; Spark gaps; Substrates; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium,1997. Proceedings
Conference_Location :
Orlando, FL, USA
Print_ISBN :
1-878303-69-4
Type :
conf
DOI :
10.1109/EOSESD.1997.634266
Filename :
634266
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2004972
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