DocumentCode :
2005153
Title :
Characterization Of ESD Damaged Magnetoresistive Recording Heads
Author :
Lam, Chung F. ; Salhi, El-Amine ; Chim, Seila
Author_Institution :
Read-rite Corporation , 44100 Osgood Road, Fremont, Ca 94538, U.s.a.
fYear :
1997
fDate :
25-25 Sept. 1997
Firstpage :
386
Lastpage :
397
Keywords :
Electric resistance; Electrical resistance measurement; Electrostatic discharge; Magnetic force microscopy; Magnetic heads; Magnetoresistance; Manufacturing; Scanning electron microscopy; Surface resistance; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium,1997. Proceedings
Conference_Location :
Orlando, FL, USA
Print_ISBN :
1-878303-69-4
Type :
conf
DOI :
10.1109/EOSESD.1997.634267
Filename :
634267
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2005153
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