DocumentCode :
2005368
Title :
Effect of random circuit fabrication errors on small signal gain and phase in traveling wave tubes
Author :
Pengvanich, Phongphaeth ; Chernin, D. ; Yue Ying Lau ; Luginsland, John W. ; Gilgenbach, Ronald M.
Author_Institution :
Dept. of Nucl. Eng. & Radiol. Sci., Michigan Univ., Ann Arbor, MI
fYear :
2008
fDate :
22-24 April 2008
Firstpage :
48
Lastpage :
49
Abstract :
Motivated by current interest in sub-mm and THz slow wave vacuum electronic amplifiers, which employ miniature, difficult-to-manufacture slow wave circuits, we evaluate the effects of small random fabrication errors on the small signal characteristics of a TWT.
Keywords :
amplifiers; travelling wave tubes; circuit phase velocity mismatch; cold tube circuit loss; random circuit fabrication errors; small signal gain; traveling wave tubes; vacuum electronic amplifiers; Circuits; Differential equations; Dispersion; Electron devices; Electron tubes; Fabrication; Manufacturing; Nuclear electronics; Numerical analysis; Signal analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Electronics Conference, 2008. IVEC 2008. IEEE International
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4244-1715-5
Type :
conf
DOI :
10.1109/IVELEC.2008.4556409
Filename :
4556409
Link To Document :
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