• DocumentCode
    2005592
  • Title

    Three-dimensional transient simulation of niagnetoresistive head temperature during an ESD event

  • Author

    Chang, Clifton

  • Author_Institution
    Seagate Technology Inc. 7801 Computer Avenue, Minneapolis, Mn 55435
  • fYear
    1997
  • fDate
    25-25 Sept. 1997
  • Firstpage
    405
  • Lastpage
    411
  • Abstract
    Melting of the sensing element in MR (magnetoresistive) heads for disc drives due to ESD events is a commonly seen mode of damage. The temperature in an MR head during an ESD event is modeled in 3 dimensions using finite-elements. Results will be given for a range of thermal and electrical properties, dimensions, and discharge time constants.
  • Keywords
    Contacts; Discrete event simulation; Electrostatic discharge; Insulation; Magnetic heads; Magnetic sensors; Resistance heating; Surface resistance; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium,1997. Proceedings
  • Conference_Location
    Orlando, FL, USA
  • Print_ISBN
    1-878303-69-4
  • Type

    conf

  • DOI
    10.1109/EOSESD.1997.634269
  • Filename
    634269
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2005592