Research on the degradation mechanisms and finite element modeling of accelerometers

The degradation mechanisms and causes of performance parameters of quartz flexible accelerometer were analyzed in this paper, and the table of accelerometers´ parametric degradation mechanisms and reason analysis (PDMRA) was made. On the basis of PDMRA, the weak links of accelerometers were analyzed, and the influence of varying external environment stress with time on accelerometers was studied, the degradation mechanisms and the corresponding locations in accelerometers were identified. Then the finite element modeling of accelerometers were established, and the algorithm processes of transient magneto-structural coupled simulation under different temperature stresses were given. Then according to the data of finite element simulation, the degradation model of accelerometers´ parameters was made. Finally, the data of accelerometer in storage condition was collected to test the degradation mechanisms model. The compared result shows that the trend of the above data which obtained from storage testing and the model was consistent. The result of this study will provide the foundation for PHM system design based on model method.