Title :
Generating pattern sequences for the pseudo-exhaustive test of MOS-circuits
Author :
Wunderlich, H.-J. ; Hellebrand, S.
Author_Institution :
Inst. of Comput. Design & Fault-Tolerance, Karlsruhe Univ., West Germany
Abstract :
A method based on linear feedback shift registers over finite fields is presented to generate for a natural number n a pattern sequence with minimal length detecting each m-multiple stuck-open faults for M>
Keywords :
field effect integrated circuits; integrated circuit testing; logic testing; shift registers; built-in self-test; linear feedback shift registers; pattern sequences; pseudo-exhaustive test; stuck-open faults; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Hardware; Registers; Test pattern generators; Variable structure systems;
Conference_Titel :
Fault-Tolerant Computing, 1988. FTCS-18, Digest of Papers., Eighteenth International Symposium on
Conference_Location :
Tokyo, Japan
Print_ISBN :
0-8186-0867-6
DOI :
10.1109/FTCS.1988.5294
