DocumentCode :
2005811
Title :
Study on fault diagnosis system design for power supplies based on built-in test theory
Author :
Mingzhu Luo ; Huiguo Zhang ; Zebing, Hou ; Dongwei, Tian ; Rui Kang
Author_Institution :
Sch. of Reliability & Syst. Eng., Beihang Univ., Beijing, China
fYear :
2011
fDate :
24-25 May 2011
Firstpage :
1
Lastpage :
5
Abstract :
Power supplies are one important type of electric products. They are widely used in both military and commercial applications. Power supply faults will directly result in system failures. For some critical systems, power supply faults can even cause a catastrophe, leading to great economic loss, casualties, and deterioration of the company´s reputation. In this paper, an approach of fault diagnosis was provided for power supply systems. Subsequently, a BIT-based implementation of the design for a switching mode power supply (SMPS) product was presented. Techniques from engineering disciplines including fault tree analysis, system level failure evolution modeling, sensor-based condition monitoring, and built-in test design were applied. After the failure diagnosis system is utilized by the customers in nuclear industry, failures of power supplies at the system level can be quickly and automatically isolated to Line Replaceable Units (LRU) in situ, which improved availability of the power supply system and reduced maintenance and support cost.
Keywords :
built-in self test; condition monitoring; cost reduction; electrical maintenance; fault diagnosis; fault trees; switched mode power supplies; BIT-based implementation; SMPS; built-in test design; economic loss; fault diagnosis system design; fault tree analysis; line replaceable units; maintenance cost; nuclear industry; power supply faults; sensor-based condition monitoring; switching mode power supply; system level failure evolution modeling; Humidity measurement; Insulated gate bipolar transistors; Irrigation; MOSFET circuits; Maintenance engineering; Prognostics and health management; Thyristors; built-in test (BIT); fault diagnosis; power supplies;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Prognostics and System Health Management Conference (PHM-Shenzhen), 2011
Conference_Location :
Shenzhen
Print_ISBN :
978-1-4244-7951-1
Electronic_ISBN :
978-1-4244-7949-8
Type :
conf
DOI :
10.1109/PHM.2011.5939519
Filename :
5939519
Link To Document :
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