Component storage reliability evaluation method based on multi-performance parameters degradation analysis

Aiming at the problem that traditional regression analysis can not reflect the randomness of performance degradation, which happened in the process of statistical analysis of component accelerated storage degradation test, the performance degradation process of the continuous cumulative damage degradation failure component is described by the stochastic process method. The component storage reliability models with the dependent and independent multi-performance parameters were established according to the analysis of the correlation among multi-performance parameters degradation, and the component storage reliability evaluation based on multi-performance parameters degradation was achieved. The method has been applied to the multi-performance parameters degradation analysis of a certain type of the tantalum capacitor and obtained the average storage life expectancy and the storage reliability of this type of the tantalum capacitor, which has certain practical value in engineering.