Title :
PHM application on estimation of storage life of the electronic components
Author :
Zhou, Xia ; Ji, Xianchun ; Hou, Xuechuan ; Zheng, Wenqiang ; Zhanag, Youguang
Author_Institution :
Failure Anal., Aerosp. Sci. & Ind. Defense Technol., R&T Center, Beijing, China
Abstract :
Introduce the issues related to PHM based on failure physics method, including its algorithmic approaches and difficulties. Study the application of PHM on estimation of storage life of the electronic components. Taking the oscillators as example, analyze and discuss the processes.
Keywords :
electronic products; failure analysis; maintenance engineering; remaining life assessment; storage; PHM; electronic components; failure method; storage life estimation; Chemicals; Electrodes; Fatigue; Humidity; Oscillators; Prognostics and health management; Thermal loading; PHM; electric components; storage life;
Conference_Titel :
Prognostics and System Health Management Conference (PHM-Shenzhen), 2011
Conference_Location :
Shenzhen
Print_ISBN :
978-1-4244-7951-1
Electronic_ISBN :
978-1-4244-7949-8
DOI :
10.1109/PHM.2011.5939531
