DocumentCode
2006084
Title
PHM application on estimation of storage life of the electronic components
Author
Zhou, Xia ; Ji, Xianchun ; Hou, Xuechuan ; Zheng, Wenqiang ; Zhanag, Youguang
Author_Institution
Failure Anal., Aerosp. Sci. & Ind. Defense Technol., R&T Center, Beijing, China
fYear
2011
fDate
24-25 May 2011
Firstpage
1
Lastpage
4
Abstract
Introduce the issues related to PHM based on failure physics method, including its algorithmic approaches and difficulties. Study the application of PHM on estimation of storage life of the electronic components. Taking the oscillators as example, analyze and discuss the processes.
Keywords
electronic products; failure analysis; maintenance engineering; remaining life assessment; storage; PHM; electronic components; failure method; storage life estimation; Chemicals; Electrodes; Fatigue; Humidity; Oscillators; Prognostics and health management; Thermal loading; PHM; electric components; storage life;
fLanguage
English
Publisher
ieee
Conference_Titel
Prognostics and System Health Management Conference (PHM-Shenzhen), 2011
Conference_Location
Shenzhen
Print_ISBN
978-1-4244-7951-1
Electronic_ISBN
978-1-4244-7949-8
Type
conf
DOI
10.1109/PHM.2011.5939531
Filename
5939531
Link To Document