Title :
230 kV optical voltage transducer using a distributed optical electric field sensor system
Author :
Chavez, Patrick P. ; Rahmatian, Farnoosh ; Jaeger, Nicolas A F
Author_Institution :
Dept. of Electr. & Comput. Eng., British Columbia Univ., Vancouver, BC, Canada
Abstract :
Optical technology for use in high-voltage (HV) environments has advanced considerably over the past decade. The design and testing of HV optical voltage transducers (OVTs) that use a series of small optical electric field sensors are described. Three 230 kV OVTs were built and were successfully tested as per IEC (60044-2 and -7), IEEE/ANSI C57.13, and BC Hydro internal specifications at Powertech Labs in Surrey, British Columbia, Canada. The devices met the accuracy requirements of IEC 0.2% class and IEEE 0.3% class and passed lightning impulse tests, chopped impulse tests, partial discharge tests, wet and dry power-frequency withstand tests, and mechanical withstand tests. Further tests showed that the OVTs maintained their calibrations in the presence of "substation-like" changes in local conductor geometry
Keywords :
calibration; electric field measurement; fibre optic sensors; high-voltage techniques; impulse testing; voltage measurement; 230 kV; BC Hydro internal specifications; Canada; Gaussian quadrature; HV environments; HV optical voltage transducers; IEC 60044-2; IEC 60044-7; IEEE/ANSI C57.13; Powertech Labs; chopped impulse tests; distributed optical electric field sensor system; dry power-frequency withstand tests; electric field effects; electric field measurement; high-voltage environments; lightning impulse tests; local conductor geometry; mechanical withstand tests; numerical analysis; optical voltage transducer; partial discharge tests; voltage measurement; wet power-frequency withstand tests; Calibration; IEC standards; Impulse testing; Lightning; Optical design; Optical sensors; Partial discharges; Sensor phenomena and characterization; Transducers; Voltage;
Conference_Titel :
Transmission and Distribution Conference and Exposition, 2001 IEEE/PES
Conference_Location :
Atlanta, GA
Print_ISBN :
0-7803-7285-9
DOI :
10.1109/TDC.2001.971222