DocumentCode :
2006206
Title :
Micro-Contact Performance Characterization of Carbon Nanotube (CNT)-Au Composite Micro-Contacts
Author :
Stilson, Christopher ; Toler, Benjamin ; Coutu, Ronald
Author_Institution :
Dept. of Electr. & Comput. Eng., Air Force Inst. of Technol., Wright-Patterson AFB, OH, USA
fYear :
2013
fDate :
22-25 Sept. 2013
Firstpage :
1
Lastpage :
9
Abstract :
This paper presents the micro-contact performance comparison between contact pairs of Au/Au and composite contact pairs Au/Au-CNT. The Au/Au-CNT micro-contact´s planar lower contact interface is an Au-CNT composite film with encapsulated CNTs. Micro-contact performance is affected by factors such as applied micro-contact force, temperature, current density, etc. At the micro-contact interface, asperities provide localized points for current flow. Increased temperature at these localized points may soften the contact metal and lead to bridge transfer. Prior work revealed that an Au/CNT contact pair performed poorly compared to an Au/Au contact pair, with two orders of magnitude difference in contact resistance. To maintain micro- contact performance and to reduce thermal effects, a Au/Au-CNT micro-contact was designed and fabricated. This design allows the micro-contact interface to remain Au/Au with the embedded CNTs acting as a thermal conduction conduit below the lower Au contact interface. The upper micro-contact support structure is an Au micromachined fixed-fixed beam with hemisphere-shaped upper contact geometry. The micro-contacts were studied under repeated cycles using an external, calibrated load, resulted in repeatable resistance of approximately 1Ω for nearly 40 million cycles. This research revealed that including a CNT composite film in the lower contact extend the operating life and lower contact resistance as compared to similarly constructed micro- contacts.
Keywords :
carbon nanotubes; composite materials; contact resistance; electrical contacts; gold; C-Au; applied microcontact force; carbon nanotube composite microcontacts; composite contact pairs; contact metal; contact resistance; current flow; encapsulated CNT film; hemisphere-shaped upper contact geometry; localized points; microcontact performance characterization; microcontact planar lower contact interface; micromachined fixed-fixed beam; thermal conduction conduit; thermal effect reduction; upper microcontact support structure; Contact resistance; Force; Gold; Plastics; Resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Holm Conference on Electrical Contacts (HOLM) , 2013 IEEE 59th
Conference_Location :
Newport, RI
ISSN :
1062-6808
Print_ISBN :
978-1-4799-1556-9
Type :
conf
DOI :
10.1109/HOLM.2013.6651419
Filename :
6651419
Link To Document :
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