• DocumentCode
    2006254
  • Title

    Modeling of the near Electrode Physics for Simulation of Arc

  • Author

    Purandare, Kedar R. ; Ahmed, Muhammad Najebul

  • Author_Institution
    Switchgear Design & Dev. Centre, Larsen & Toubro Ltd., Mumbai, India
  • fYear
    2013
  • fDate
    22-25 Sept. 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper presents a numerical model of physical phenomena taking place between the contacts of a switchgear device during fault. Particularly the regions adjacent to cathode and anode are modeled in MATLAB. The effect of system impedance on arc current has been considered. A numerical model of near electrode physics is solved to predict the arc behavior with the design parameters like electrode materials, pressure, impedance etc. With this model we can identify the interface behavior of plasma and electrode; this is done by identifying the layers like sheath and ionization based on the temperature distribution. This model solves the equations of cathode region (cathode surface, sheath and ionization zone) and anode region (Anode surface, sheath and ionization zone) to evaluate their effect on the total arc voltage in a 2-D simulation (z, t) in MATLAB. The same can be extended to 4-D simulation (x,y,z,t) with CFD tools for which work is in progress.
  • Keywords
    anodes; cathodes; circuit-breaking arcs; electrical contacts; ionisation; mathematics computing; power engineering computing; switchgear; temperature distribution; 2D simulation; MATLAB; anode region; anode surface; arc behavior prediction; arc current; arc simulation; arc voltage; cathode region; cathode surface; ionization layers; ionization zone; near electrode physics modelling; plasma-electrode interface behavior; sheath layers; switchgear device contacts; temperature distribution; Anodes; Cathodes; Integrated circuit modeling; Ionization; Mathematical model; Plasmas;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Holm Conference on Electrical Contacts (HOLM) , 2013 IEEE 59th
  • Conference_Location
    Newport, RI
  • ISSN
    1062-6808
  • Print_ISBN
    978-1-4799-1556-9
  • Type

    conf

  • DOI
    10.1109/HOLM.2013.6651420
  • Filename
    6651420