DocumentCode :
2006266
Title :
Physics of the gap formation in half-Heusler compounds and bismuth chalcogenide systems
Author :
Mahanti, S.D. ; Larson, P. ; Kanatzidis, M.G.
Author_Institution :
Dept. of Phys. & Astron., Michigan State Univ., East Lansing, MI, USA
fYear :
1999
fDate :
Aug. 29 1999-Sept. 2 1999
Firstpage :
52
Lastpage :
55
Abstract :
Using first principles electronic structure calculations based on the density functional theory, we discuss the reasons behind the formation of energy gaps in different classes of narrow-gap semiconductors which are either good or promising thermoelectrics. We find that in half-Heusler compounds such as ZrNiSn and YNiSb, the Ni atoms take active role in the gap formation, both through local symmetry breaking and hybridization. In Bi/sub 2/Te/sub 3/, the best known room temperature thermoelectric, the subtle gap structure is determined by both spin-orbit interaction and hybridization of Bi p and Te p bands. In other Bi chalcogenides and complex ternary systems containing Bi and Te, it appears that spin-orbit interaction does not play as important a role. We discuss possible reasons for this difference.
Keywords :
bismuth compounds; density functional theory; energy gap; narrow band gap semiconductors; nickel compounds; spin-orbit interactions; thermoelectricity; yttrium compounds; zirconium compounds; 20 C; Bi chalcogenides; Bi/sub 2/Te/sub 3/; YNiSb; ZrNiSn; bismuth chalcogenide systems; density functional theory; energy gaps; first principles electronic structure calculations; gap formation; half-Heusler compounds; hybridization; local symmetry breaking; narrow-gap semiconductors; p bands; room temperature; spin-orbit interaction; Astrochemistry; Astronomy; Bismuth; Density functional theory; Physics; Tellurium; Temperature; Thermoelectricity; Tin; Zirconium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermoelectrics, 1999. Eighteenth International Conference on
Conference_Location :
Baltimore, MD, USA
ISSN :
1094-2734
Print_ISBN :
0-7803-5451-6
Type :
conf
DOI :
10.1109/ICT.1999.843332
Filename :
843332
Link To Document :
بازگشت