• DocumentCode
    2006316
  • Title

    Understanding the effect of electron gun geometry on emission characteristics for the purpose of optimizing the VAPoR time-of-flight mass spectrometer

  • Author

    Southard, Adrian E. ; Getty, Stephanie A. ; Costen, Nicholas P. ; Hidrobo, Gregory B. ; Glavin, Daniel P.

  • Author_Institution
    Goddard Space Flight Center, Univ. Space Res. Agency, NASA, Greenbelt, MD, USA
  • fYear
    2012
  • fDate
    27-27 March 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Simulations of field emission of electrons from a custom built electron gun are used to determine the effect that offsets in alignment of the cathode to the grid and the cathode to grid gap have on the trajectories of electrons transmitted through the grid. The simulations are a first step towards understanding how to optimize the electron gun and determine the magnitude of optical aberrations that limit focusing of the emitted electron beam. A finite element method is employed to simulate field emission from the cathode, an array of carbon nanotube pillars. This is done using a three dimensional model that attempts to account for field enhancement due to both the pillar geometry and individual carbon nanotubes. Qualitative comparisons of the configurations tested indicate larger transmissivity through the grid can be achieved by offsetting the pillar array but only at the expense of a skewed elevation angle distribution.
  • Keywords
    aberrations; carbon nanotubes; cathodes; electron field emission; electron guns; finite element analysis; nanotube devices; time of flight mass spectrometers; C; VAPoR time-of-flight mass spectrometer optimization; carbon nanotube pillars array; cathode alignment; custom built electron gun optimization; electron field emission simulation; electron gun geometry; electron transmitted trajectory; emission characteristics; emitted electron beam; field enhancement; finite element method; grid gap; optical aberration magnitude; pillar geometry; qualitative comparison; skewed elevation angle distribution; three dimensional model; Arrays; Carbon nanotubes; Cathodes; Electric fields; Electron beams; Electron optics; Geometry; Electron gun; computer simulation; mass spectroscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems for Measurement and Instrumentation (MAMNA), 2012
  • Conference_Location
    Annapolis, MD
  • Print_ISBN
    978-1-4673-1781-8
  • Type

    conf

  • DOI
    10.1109/MAMNA.2012.6195104
  • Filename
    6195104