• DocumentCode
    2006452
  • Title

    Artificially ordered BiSb alloys: growth and transport properties

  • Author

    Cho, Sunglae ; Kim, Yunki ; DiVenere, Antonio ; Wong, George K.L. ; Freeman, Arthur J. ; Ketterson, John B. ; Olafsen, Linda J. ; Vurgaftman, Igor ; Meyer, Jerry R. ; Hoffman, Craig A.

  • Author_Institution
    Dept. of Phys. & Astron., Northwestern Univ., Evanston, IL, USA
  • fYear
    1999
  • fDate
    Aug. 29 1999-Sept. 2 1999
  • Firstpage
    104
  • Lastpage
    107
  • Abstract
    We propose a new approach for potentially achieving high-ZT materials: artificially ordered alloy structures. We have prepared artificially ordered Bi/Sb alloys with different (Bi/Sb) periods from 7.7 /spl Aring/ to 55 /spl Aring/ by MBE. Atomic-scale ordering effects on the structural and transport properties have been studied. The formation of an ordered alloy was confirmed by the presence of XRD superlattice satellites. Using electrical resistivity, thermopower, and magneto-transport measurements, we have observed a semimetal-semiconductor transition in an ordered BiSb superlattice. The intentional ordering of the layered Bi-Sb structure has produced a new phase and the measured differences in the electronic spectrum relative to the random alloy are a consequence of its atomic structure.
  • Keywords
    X-ray diffraction; antimony alloys; bismuth alloys; electrical resistivity; interface structure; magnetoresistance; molecular beam epitaxial growth; semiconductor superlattices; thermoelectric power; 7.7 to 55 A; Bi-Sb; BiSb; MBE; XRD superlattice satellites; artificially ordered BiSb alloys; artificially ordered alloy structures; atomic-scale ordering effects; electrical resistivity; growth; high-ZT materials; magneto-transport; ordered BiSb superlattice; semimetal-semiconductor transition; structural properties; thermopower; transport properties; Atomic layer deposition; Atomic measurements; Bismuth; Electric resistance; Electric variables measurement; Magnetic superlattices; Phase measurement; Satellites; Tin alloys; X-ray scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermoelectrics, 1999. Eighteenth International Conference on
  • Conference_Location
    Baltimore, MD, USA
  • ISSN
    1094-2734
  • Print_ISBN
    0-7803-5451-6
  • Type

    conf

  • DOI
    10.1109/ICT.1999.843344
  • Filename
    843344