• DocumentCode
    2006498
  • Title

    Flexible and stretchable dielectrics

  • Author

    Bauer, Siegfried

  • Author_Institution
    Soft Matter Phys., Johannes Kepler Univ., Linz, Austria
  • fYear
    2010
  • fDate
    4-9 July 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A brief tour d´horizon is given through recent research on flexible and stretchable dielectrics. Ultrathin dielectrics with low leakage currents and high breakdown strength are essential in flexible electronic devices, illustrated with low voltage field-effect transistors for optothermal sensing and flash memories. Electrets with a permanently stored electrical charge are useful to control the threshold voltage in field-effect devices. Ferroelectrets with internally charged voids have been introduced in a ferroelectret field-effect configuration for piezoelectric transducers and microphones. Flexible dielectrics displaying ferro-, piezo- and pyroelectricity are employed in memories and in transducer functions. Finally compliant dielectrics are investigated in elastomer actuators and energy harvesters. The chosen examples show that research on flexible and soft dielectrics is actively pursued in various branches of science, with prospect for future flexible and stretchable electronic products.
  • Keywords
    dielectric devices; electrets; leakage currents; elastomer actuators; electrical charge; energy harvesters; ferroelectret field-effect configuration; field effect devices; flash memories; flexible dielectrics; flexible electronic devices; high breakdown strength; low leakage currents; low voltage field-effect transistors; microphones; optothermal sensing; piezoelectric transducers; stretchable dielectrics; threshold voltage; ultrathin dielectrics; Actuators; Dielectrics; Electrets; Energy harvesting; Logic gates; Sensors; Transistors; electrets; energy harvesting; ferroelectrets; flexible dielectrics; memories; transducers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid Dielectrics (ICSD), 2010 10th IEEE International Conference on
  • Conference_Location
    Potsdam
  • Print_ISBN
    978-1-4244-7945-0
  • Electronic_ISBN
    978-1-4244-7943-6
  • Type

    conf

  • DOI
    10.1109/ICSD.2010.5568254
  • Filename
    5568254