• DocumentCode
    2006565
  • Title

    The effect of pulse width modulation (PWM) frequency on the reliability of thermoelectric modules

  • Author

    Nagy, Michael J. ; Roman, Steven J.

  • Author_Institution
    TE Technol. Inc., Traverse City, MI, USA
  • fYear
    1999
  • fDate
    Aug. 29 1999-Sept. 2 1999
  • Firstpage
    123
  • Lastpage
    125
  • Abstract
    Pulse-width-modulation (PWM) control has many benefits when used to control power to thermoelectric modules (TEM´s). This scheme allows the use of smaller, lighter circuitry that dissipates less heat than a comparable linear controller. However, abruptly turning power on and off to a TEM has been known to cause thermal cycling which reduces the reliability of the module. This thermal cycling fatigues the solder junctions causing an increase in the module´s electrical resistance. As a result, some system designers have been reluctant to use PWM controllers in their cooling equipment. This paper quantifies the effect of PWM control on the reliability of TEM. TEM´s are powered with PWM signals of various frequencies from 0.1 Hz to 10 kHz. The electrical resistance of these modules is then tracked throughout the duration of the test. These changes in electrical resistances are used to directly correlate the frequency of PWM control with TEM reliability.
  • Keywords
    modules; pulse width modulation; reliability; temperature control; thermal management (packaging); thermoelectric devices; 0.1 Hz to 10 kHz; PWM control; PWM frequency; cooling equipment; electrical resistance changes; pulse width modulation control; reliability; solder junction fatigue; thermal cycling; thermoelectric modules; Circuits; Electric resistance; Frequency modulation; Lighting control; Power system reliability; Pulse width modulation; Space vector pulse width modulation; Temperature control; Thermoelectricity; Turning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermoelectrics, 1999. Eighteenth International Conference on
  • Conference_Location
    Baltimore, MD, USA
  • ISSN
    1094-2734
  • Print_ISBN
    0-7803-5451-6
  • Type

    conf

  • DOI
    10.1109/ICT.1999.843348
  • Filename
    843348