Title :
A review of the research on quantitative reliability Prediction and Assessment for electronic components
Author :
Zhao, Yang ; Yin, Xiaoyan ; Kang, Rui ; Trivedi, Kishor S.
Author_Institution :
Sch. of Reliability & Syst. Eng., Beihang Univ., Beijing, China
Abstract :
A review is carried out on how quantitative approaches have been applied so far to the Reliability Prediction and Assessment (RPA) for computer and communication systems. A series of the reliability evaluation technology based on analytic models and computer simulations are developed for use in product design and test, shape, system operation and maintenance, during a research initiative towards understanding the quantitative characteristics of hardware and software systems. The implementation of these techniques guarantees that the sophisticated system satisfying the high standard on reliability, availability, performability, maintainability and safety. Such approaches conduct quantitative assessment for reliability at the system level. Such reliability quantitative assessments are effectively used in the system decision-making for fault detection, failures elimination, optimization, maintenance and safety.
Keywords :
decision making; failure analysis; life testing; reliability; standards; electronic components; failures elimination; fault detection; maintenance; optimization; reliability evaluation technology; reliability prediction and assessment; safety; system decision-making; Aerospace engineering; Companies; Continuous wavelet transforms; Random access memory; Software; Software reliability; Assessment; Prediction; Reliability;
Conference_Titel :
Prognostics and System Health Management Conference (PHM-Shenzhen), 2011
Conference_Location :
Shenzhen
Print_ISBN :
978-1-4244-7951-1
Electronic_ISBN :
978-1-4244-7949-8
DOI :
10.1109/PHM.2011.5939553