• DocumentCode
    2006663
  • Title

    Electrical breakdown in soft elastomers: Stiffness dependence in un-pre-stretched elastomers

  • Author

    Kollosche, M. ; Stoyanov, H. ; Ragusch, H. ; Risse, S. ; Becker, A. ; Kofod, G.

  • Author_Institution
    Inst. of Phys. & Astron., Univ. of Potsdam, Potsdam, Germany
  • fYear
    2010
  • fDate
    4-9 July 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The relation between electrical breakdown and mechanical properties in soft polymeric materials is of particular interest for multiple applications, such as smart and flexible materials. In the literature, this relation is commonly investigated by variation of temperature, which indirectly causes a change in mechanical properties, but it also affects other factors that may influence the electrical breakdown, such as conductivity. Here, we present experiments that are performed at a constant temperature, on blends of chemically identical tri-block thermoplastic elastomers with different stiffnesses. Stress-strain measurements proved that continuous variation in mechanical properties could be obtained, here a range of 94-316 kPa was found. Breakdown measurements found that the breakdown field increases with Youngs modulus. The results were compared to several theories in literature, however, only the recently proposed theory of [5] was found to explain the observations adequately.
  • Keywords
    Young´s modulus; elastic constants; elastomers; electric breakdown; electrical conductivity; Youngs modulus; conductivity; electrical breakdown; soft elastomer; soft polymeric material; stiffness; stress-strain measurement; temperature; triblock thermoplastic elastomer; un-pre-stretched elastomer; Data models; Dielectrics; Electric breakdown; Load modeling; Materials; Strain; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid Dielectrics (ICSD), 2010 10th IEEE International Conference on
  • Conference_Location
    Potsdam
  • Print_ISBN
    978-1-4244-7945-0
  • Electronic_ISBN
    978-1-4244-7943-6
  • Type

    conf

  • DOI
    10.1109/ICSD.2010.5568259
  • Filename
    5568259