• DocumentCode
    2006832
  • Title

    Automated Noise and Gain Measurement Set-Up and Application to Noise Modelling

  • Author

    Byzery, Bernard

  • Author_Institution
    Laboratoires d´´Electronique Philips, 3 avenue Descartes, 94451 Limeil-Brevannes, France
  • fYear
    1989
  • fDate
    4-7 Sept. 1989
  • Firstpage
    1201
  • Lastpage
    1204
  • Abstract
    For a circuit designer, the determination of the small signal equivalent circuit and the noise parameters of the FETs are the most important. The comparison of different devices and the qualification of noise models require a precise determination of the noise parameters. The aim of this paper is to describe a completely automated noise characterization set-up and the application to the extraction of equivalent noise parameters.
  • Keywords
    Automatic control; Circuit noise; FETs; Frequency; Gain measurement; Impedance measurement; Noise figure; Noise generators; Noise measurement; Tuners;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 1989. 19th European
  • Conference_Location
    London, UK
  • Type

    conf

  • DOI
    10.1109/EUMA.1989.334136
  • Filename
    4132841