DocumentCode
2006832
Title
Automated Noise and Gain Measurement Set-Up and Application to Noise Modelling
Author
Byzery, Bernard
Author_Institution
Laboratoires d´´Electronique Philips, 3 avenue Descartes, 94451 Limeil-Brevannes, France
fYear
1989
fDate
4-7 Sept. 1989
Firstpage
1201
Lastpage
1204
Abstract
For a circuit designer, the determination of the small signal equivalent circuit and the noise parameters of the FETs are the most important. The comparison of different devices and the qualification of noise models require a precise determination of the noise parameters. The aim of this paper is to describe a completely automated noise characterization set-up and the application to the extraction of equivalent noise parameters.
Keywords
Automatic control; Circuit noise; FETs; Frequency; Gain measurement; Impedance measurement; Noise figure; Noise generators; Noise measurement; Tuners;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 1989. 19th European
Conference_Location
London, UK
Type
conf
DOI
10.1109/EUMA.1989.334136
Filename
4132841
Link To Document