Title :
A new statistical testing for random numbers and its application to some cryptographic problems
Author :
Ryabko, B.Ya. ; Stognienko, V.S. ; Shokin, Yu.I.
Author_Institution :
Institute of Computational Technology of Siberian, Branch of Russian Academy of Science
fDate :
29 June-4 July 2003
Keywords :
Artificial intelligence; Cryptography; Frequency estimation; Mathematics; Process design; Statistical analysis; Testing; Variable structure systems;
Conference_Titel :
Information Theory, 2003. Proceedings. IEEE International Symposium on
Print_ISBN :
0-7803-7728-1
DOI :
10.1109/ISIT.2003.1228353
