Title :
On achievable key rates for universal simulation of random data with respect to a set of statistical tests
Author_Institution :
Technion
fDate :
29 June-4 July 2003
Keywords :
Discrete event simulation; Frequency; Probability; Testing;
Conference_Titel :
Information Theory, 2003. Proceedings. IEEE International Symposium on
Print_ISBN :
0-7803-7728-1
DOI :
10.1109/ISIT.2003.1228355
