Title :
Characterization of the random scattering induced delay power spectrum using Born series
Author :
Zhou, Junhe ; Yin, Xuefeng ; Tian, Li ; Tong, Meisong ; Zhong, Zhimeng ; Lu, Stan X.
Author_Institution :
Dept. of Electron. Sci. & Technol., Tongji Univ., Shanghai, China
Abstract :
In this work, the delay power spectrum due to random scattering in wireless propagation is analyzed. The analysis shows the final impulse response introduced by the random scattering is actually the inverse Fourier transform of the Born series. Conclusion from the theory will be helpful in the simulations and measurements of the wireless channels.
Keywords :
Fourier transforms; electromagnetic wave scattering; inverse transforms; radiowave propagation; wireless channels; Born series; impulse response; inverse Fourier transform; random scattering induced delay power spectrum; wireless channel measurement; wireless propagation; Delay; Equations; Frequency domain analysis; Mathematical model; Receivers; Scattering; Transmitters; analytical formula; fading; random matrix;
Conference_Titel :
Antennas and Propagation (APSURSI), 2011 IEEE International Symposium on
Conference_Location :
Spokane, WA
Print_ISBN :
978-1-4244-9562-7
DOI :
10.1109/APS.2011.6058692
