DocumentCode
2006910
Title
Characterization of the random scattering induced delay power spectrum using Born series
Author
Zhou, Junhe ; Yin, Xuefeng ; Tian, Li ; Tong, Meisong ; Zhong, Zhimeng ; Lu, Stan X.
Author_Institution
Dept. of Electron. Sci. & Technol., Tongji Univ., Shanghai, China
fYear
2011
fDate
3-8 July 2011
Firstpage
3317
Lastpage
3319
Abstract
In this work, the delay power spectrum due to random scattering in wireless propagation is analyzed. The analysis shows the final impulse response introduced by the random scattering is actually the inverse Fourier transform of the Born series. Conclusion from the theory will be helpful in the simulations and measurements of the wireless channels.
Keywords
Fourier transforms; electromagnetic wave scattering; inverse transforms; radiowave propagation; wireless channels; Born series; impulse response; inverse Fourier transform; random scattering induced delay power spectrum; wireless channel measurement; wireless propagation; Delay; Equations; Frequency domain analysis; Mathematical model; Receivers; Scattering; Transmitters; analytical formula; fading; random matrix;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation (APSURSI), 2011 IEEE International Symposium on
Conference_Location
Spokane, WA
ISSN
1522-3965
Print_ISBN
978-1-4244-9562-7
Type
conf
DOI
10.1109/APS.2011.6058692
Filename
6058692
Link To Document