• DocumentCode
    2007022
  • Title

    Modeling and reduction of conducted EMI in SiC JFET motor drives with insulated metal substrate

  • Author

    Gong, Xun ; Ferreira, J.A.

  • Author_Institution
    Electr. Sustainable Energy, Delft Univ. of Technol., Delft, Netherlands
  • fYear
    2012
  • fDate
    15-20 Sept. 2012
  • Firstpage
    629
  • Lastpage
    636
  • Abstract
    This paper presents the suppression of conducted common mode (CM) Electromagnetic Interference (EMI) in an inverter for motor drive with discrete Silicon Carbide (SiC) JFETs attached on top of the Insulated Metal Substrate (IMS). The EMC performance of the IMS inverter is compared with a heat sink inverter in a similar circuit layout. Both are under the same influence of parasitic couplings between the SiC JFET drains and substrate base plate. It is found that although the application of conventional CM filters effectively suppresses the emitted noise in the low frequency (LF) range, the capacitive coupling influence results in slight or no improvement in the middle frequency (MF) and high frequency (HF) range. To deal with this problem, a system CM equivalent circuit model with extracted parasitic parameters is proposed. The model is able to evaluate the filter insertion losses over a broad conducted EMI frequency band, which is essential to achieve an optimized filter design balanced between performance and cost. The presented experimental and calculated results form the step-by-step guideline that effectively suppresses the generated EMI to comply with the standard prescribed by IEC61800-3 C2: Qp.
  • Keywords
    IEC standards; electromagnetic interference; invertors; motor drives; silicon compounds; EMC performance; IEC61800-3 C2: Qp; IMS inverter; JFET motor drives; SiC; broad conducted EMI frequency band; conducted EMI modeling; conducted EMI reduction; conducted common mode; discrete silicon carbide; electromagnetic interference; insulated metal substrate; inverter; middle frequency; parasitic parameters; step-by-step guideline; Couplings; Electromagnetic interference; Insertion loss; Inverters; JFETs; Noise; Silicon carbide; Common mode (CM); Electromagnetic Interference (EMI); Insulated Metal Substrate; Motor Drive; Silicon Carbide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Energy Conversion Congress and Exposition (ECCE), 2012 IEEE
  • Conference_Location
    Raleigh, NC
  • Print_ISBN
    978-1-4673-0802-1
  • Electronic_ISBN
    978-1-4673-0801-4
  • Type

    conf

  • DOI
    10.1109/ECCE.2012.6342762
  • Filename
    6342762