Title :
KA and Ray tracing approximation on the surface roughness
Author :
Yoon, Young-Keun ; Kim, JongHo
Author_Institution :
Radio Technol. Res. Dept., Electron. & Telecommun. Res. Inst., Daejeon, South Korea
Abstract :
This paper is given the results compared Kirchhoff with ray tracing method for scattering characteristics due to the roughness on the periodic surface. Analysis method used first order Kirchhoff approximation and ray tracing based on viewing volume tube. Finally, there is proved that the provided approximation methods are possible to support to extract practical scattering characteristics.
Keywords :
approximation theory; electromagnetic wave scattering; ray tracing; surface roughness; first order Kirchhoff approximation; periodic surface; ray tracing approximation; scattering characteristics; surface roughness; viewing volume tube; Approximation methods; Optical surface waves; Ray tracing; Rough surfaces; Scattering; Surface roughness; Surface waves; approximation; millimeter; rough; tracing;
Conference_Titel :
Antennas and Propagation (APSURSI), 2011 IEEE International Symposium on
Conference_Location :
Spokane, WA
Print_ISBN :
978-1-4244-9562-7
DOI :
10.1109/APS.2011.6058705
