DocumentCode :
2007185
Title :
Path loss and cell coverage of urban microcells in high-rise building environments
Author :
Niu, Feng ; Bertoni, Henry L.
Author_Institution :
Center for Adv. Technol. in Telecommun., Polytechnic Univ., Brooklyn, NY, USA
fYear :
1993
fDate :
29 Nov-2 Dec 1993
Firstpage :
266
Abstract :
This paper proposes an RF propagation model to predict the sector average signal (or path loss) for the low base station antennas proposed for microcellular systems in high-rise building environments. The model predicts the signal for both the line-of-sight (LOS) and non-LOS cases. For non-LOS paths, rays that are diffracted at the building corners, as well as reflected rays are accounted for. The results agree with available experimental data. Using this model, we show how the signal on non-LOS paths depends on the specific location of the base station. It is found that the received signal suffers 15 to 20 dB loss when the mobile turns a corner from the LOS street containing the base station into a cross street, or from a cross street into a street parallel to the LOS street
Keywords :
cellular radio; electromagnetic wave absorption; electromagnetic wave diffraction; electromagnetic wave reflection; radio stations; radiowave propagation; 15 to 20 dB; RF propagation model; cell coverage; diffracted rays; high-rise building environments; line-of-sight; low base station antennas; nonLOS paths; path loss; received signal; reflected rays; sector average signal; streets; urban microcells; Antennas and propagation; Base stations; Diffraction; Microcell networks; Mobile antennas; Optical reflection; Predictive models; Propagation losses; RF signals; Radio frequency;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Global Telecommunications Conference, 1993, including a Communications Theory Mini-Conference. Technical Program Conference Record, IEEE in Houston. GLOBECOM '93., IEEE
Conference_Location :
Houston, TX
Print_ISBN :
0-7803-0917-0
Type :
conf
DOI :
10.1109/GLOCOM.1993.318073
Filename :
318073
Link To Document :
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