• DocumentCode
    2007201
  • Title

    Effects of perturbing B-field orientation on magnetic priming of a Relativistic Magnetron

  • Author

    Hoff, Brad W. ; Gilgenbach, Ronald M. ; Jordan, Nick M. ; Lau, Yue Y. ; Cruz, Edward ; French, David ; Gomez, Matthew R. ; Zier, Jacob C. ; Spencer, T.A. ; Price, D.

  • Author_Institution
    Dept. of Nucl. Eng. & Radiol. Sci., Univ. of Michigan, Ann Arbor, MI
  • fYear
    2008
  • fDate
    22-24 April 2008
  • Firstpage
    270
  • Lastpage
    271
  • Abstract
    Experiments have been performed testing magnetic priming at the cathode of a relativistic magnetron to study the effects on high power microwave performance. Magnetic perturbations were imposed utilizing three, high-permeability nickel-iron wires embedded beneath the emission region of a 1.27 cm diameter cathode, spaced 120 degrees apart (for N/2 symmetry in an N (6) cavity magnetron). These three, high-permeability wires perturb both the axial and radial magnetic fields near the emission region of the cathode. Magnetic priming was demonstrated at UM to increase the percentage of p-mode shots by 15% over the baseline case in the relativistic magnetron. Improvements in microwave power, pulse width and start-oscillation time were also observed. Earlier experimental research by Neculaes and recent simulation work suggest that using permanent magnets with radially-directed remanence fields centered under the cathode emission region instead of high permeability wires can yield improved magnetron performance.
  • Keywords
    magnetrons; NiFe; high power microwave performance; high-permeability nickel-iron wires; magnetic perturbations; magnetic priming; perturbing B-field orientation; relativistic magnetron cathode; size 1.27 cm; Anodes; Cathodes; Laboratories; Magnetic fields; Magnetostatics; Microwave ovens; Permanent magnets; Saturation magnetization; Testing; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference, 2008. IVEC 2008. IEEE International
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    978-1-4244-1715-5
  • Type

    conf

  • DOI
    10.1109/IVELEC.2008.4556506
  • Filename
    4556506