DocumentCode :
2007207
Title :
New charge pumping method for direct measurement of spatial distribution of fixed charge
Author :
Tsuchiaki, M. ; Momose, H.S. ; Morimoto, T. ; Iwai, H.
Author_Institution :
ULSI Research Center, Toshiba Corporation, Japan
fYear :
1991
fDate :
28-30 May 1991
Firstpage :
19
Lastpage :
20
Keywords :
Charge measurement; Charge pumps; Current measurement; Density measurement; Energy measurement; Hot carriers; Interface states; MOSFET circuits; Noise measurement; Stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Technology, 1991. Digest of Technical Papers., 1991 Symposium on
Conference_Location :
Oiso, Japan
Type :
conf
DOI :
10.1109/VLSIT.1991.705969
Filename :
705969
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2007207
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