• DocumentCode
    2007302
  • Title

    Statistical lag time in fluctuation model of liquid dielectric breakdown and experimental results

  • Author

    Klimkin, V.F. ; Kupershtokh, A.L.

  • Author_Institution
    Dept. of Phys., Novosibirsk Univ., Russia
  • fYear
    1993
  • fDate
    19-23 Jul 1993
  • Firstpage
    395
  • Lastpage
    399
  • Abstract
    The electric breakdown of liquid dielectrics in a uniform field for the nanosecond time range is examined. Experiments on electric breakdown of n-hexane were performed. The time values were registered and analyzed by computer. Results of numerical calculations with a fluctuation model and experimental results for nanosecond breakdowns form the anode are in qualitative agreement. The fluctuation model makes it possible to explain the experimental results and to reveal theoretical dependences of basic characteristics for the breakdown lag phenomenon in the case of uniform and quasi-uniform fields
  • Keywords
    electric breakdown; breakdown lag phenomenon; electric breakdown; fluctuation model; liquid dielectric breakdown; liquid dielectrics; n-hexane; nanosecond breakdowns; nanosecond time range; quasi-uniform fields; statistical time lag; uniform field; Anodes; Breakdown voltage; Dielectric breakdown; Dielectric liquids; Electric breakdown; Electrodes; Fluctuations; Histograms; Probability; Solid modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Conduction and Breakdown in Dielectric Liquids,1993., ICDL '93., IEEE 11th International Conference on
  • Conference_Location
    Baden-Dattwil
  • Print_ISBN
    0-7803-0791-7
  • Type

    conf

  • DOI
    10.1109/ICDL.1993.593974
  • Filename
    593974