DocumentCode
2007302
Title
Statistical lag time in fluctuation model of liquid dielectric breakdown and experimental results
Author
Klimkin, V.F. ; Kupershtokh, A.L.
Author_Institution
Dept. of Phys., Novosibirsk Univ., Russia
fYear
1993
fDate
19-23 Jul 1993
Firstpage
395
Lastpage
399
Abstract
The electric breakdown of liquid dielectrics in a uniform field for the nanosecond time range is examined. Experiments on electric breakdown of n-hexane were performed. The time values were registered and analyzed by computer. Results of numerical calculations with a fluctuation model and experimental results for nanosecond breakdowns form the anode are in qualitative agreement. The fluctuation model makes it possible to explain the experimental results and to reveal theoretical dependences of basic characteristics for the breakdown lag phenomenon in the case of uniform and quasi-uniform fields
Keywords
electric breakdown; breakdown lag phenomenon; electric breakdown; fluctuation model; liquid dielectric breakdown; liquid dielectrics; n-hexane; nanosecond breakdowns; nanosecond time range; quasi-uniform fields; statistical time lag; uniform field; Anodes; Breakdown voltage; Dielectric breakdown; Dielectric liquids; Electric breakdown; Electrodes; Fluctuations; Histograms; Probability; Solid modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Conduction and Breakdown in Dielectric Liquids,1993., ICDL '93., IEEE 11th International Conference on
Conference_Location
Baden-Dattwil
Print_ISBN
0-7803-0791-7
Type
conf
DOI
10.1109/ICDL.1993.593974
Filename
593974
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