DocumentCode
2007541
Title
Demonstration of low voltage and functionally complete logic operations using body-biased complementary and ultra-thin ALN piezoelectric mechanical switches
Author
Sinha, Nipun ; Jones, Timothy ; Guo, Zhijun ; Piazza, Gianluca
Author_Institution
Univ. of Pennsylvania, Philadelphia, PA, USA
fYear
2010
fDate
24-28 Jan. 2010
Firstpage
751
Lastpage
754
Abstract
This paper reports, for the first time, on the demonstration of low voltage and functionally complete logic elements (NAND and NOR) implemented by using body-biased complementary and ultra-thin (250 nm thick) Aluminum Nitride (AlN) based piezoelectric mechanical switches. This work presents, firstly, the importance of scaling AlN films for the demonstration of ultra-thin AlN switches and, secondly, the implementation of a new actuation scheme based on body biasing to lower the switch threshold voltage. Four of these ultra-thin switches were connected together to synthesize functionally complete MEMS logic gates (NAND and NOR) with a ± 2V swing and a body-bias voltage < 8 V.
Keywords
aluminium compounds; logic gates; microswitches; piezoelectric actuators; semiconductor thin films; AlN; MEMS logic gate; NAND logic gate; NOR logic gate; body-biased complementary; functionally complete logic element; logic operation; low voltage; scaling AlN films; switch threshold voltage; ultra-thin AlN piezoelectric mechanical switch; Air gaps; Energy consumption; Logic; Low voltage; MOSFETs; Microswitches; Nanoelectromechanical systems; Piezoelectric films; Switches; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Micro Electro Mechanical Systems (MEMS), 2010 IEEE 23rd International Conference on
Conference_Location
Wanchai, Hong Kong
ISSN
1084-6999
Print_ISBN
978-1-4244-5761-8
Electronic_ISBN
1084-6999
Type
conf
DOI
10.1109/MEMSYS.2010.5442297
Filename
5442297
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