• DocumentCode
    2007541
  • Title

    Demonstration of low voltage and functionally complete logic operations using body-biased complementary and ultra-thin ALN piezoelectric mechanical switches

  • Author

    Sinha, Nipun ; Jones, Timothy ; Guo, Zhijun ; Piazza, Gianluca

  • Author_Institution
    Univ. of Pennsylvania, Philadelphia, PA, USA
  • fYear
    2010
  • fDate
    24-28 Jan. 2010
  • Firstpage
    751
  • Lastpage
    754
  • Abstract
    This paper reports, for the first time, on the demonstration of low voltage and functionally complete logic elements (NAND and NOR) implemented by using body-biased complementary and ultra-thin (250 nm thick) Aluminum Nitride (AlN) based piezoelectric mechanical switches. This work presents, firstly, the importance of scaling AlN films for the demonstration of ultra-thin AlN switches and, secondly, the implementation of a new actuation scheme based on body biasing to lower the switch threshold voltage. Four of these ultra-thin switches were connected together to synthesize functionally complete MEMS logic gates (NAND and NOR) with a ± 2V swing and a body-bias voltage < 8 V.
  • Keywords
    aluminium compounds; logic gates; microswitches; piezoelectric actuators; semiconductor thin films; AlN; MEMS logic gate; NAND logic gate; NOR logic gate; body-biased complementary; functionally complete logic element; logic operation; low voltage; scaling AlN films; switch threshold voltage; ultra-thin AlN piezoelectric mechanical switch; Air gaps; Energy consumption; Logic; Low voltage; MOSFETs; Microswitches; Nanoelectromechanical systems; Piezoelectric films; Switches; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems (MEMS), 2010 IEEE 23rd International Conference on
  • Conference_Location
    Wanchai, Hong Kong
  • ISSN
    1084-6999
  • Print_ISBN
    978-1-4244-5761-8
  • Electronic_ISBN
    1084-6999
  • Type

    conf

  • DOI
    10.1109/MEMSYS.2010.5442297
  • Filename
    5442297