Title :
Proceedings. IEEE International SOC Conference (IEEE Cat. No.04TH8744)
Abstract :
The following topics are dealt with: reconfigurable applications; on-chip testing of embedded silicon transducers; multithreshold circuits; analog to digital conversion; system level architecture and design; deep-submicron design; RF circuits; design and analysis tools; low power signal processing; embedded processors; SOC; high performance systems and architectures; design for testability; design for reliability; low power design; network processing architectures and circuits; reconfigurable architectures; analog circuits; interconnect modeling; wireless communication; digital signal processing; and low power architecture.
Keywords :
analogue circuits; analogue-digital conversion; design for testability; embedded systems; integrated circuit design; integrated circuit interconnections; integrated circuit modelling; integrated circuit testing; low-power electronics; radiofrequency integrated circuits; reconfigurable architectures; signal processing; system-on-chip; transducers; RF circuits; SOC; analog circuits; analog-digital conversion; deep-submicron design; design for reliability; design for testability; digital signal processing; embedded processors; embedded silicon transducers; interconnect modeling; low power architecture; low power design; low power signal processing; multithreshold circuits; network processing circuits; on-chip transducer testing; reconfigurable applications; reconfigurable architectures; wireless communication;
Conference_Titel :
SOC Conference, 2004. Proceedings. IEEE International
Conference_Location :
Santa Clara, CA, USA
Print_ISBN :
0-7803-8445-8
DOI :
10.1109/SOCC.2004.1362314
