DocumentCode :
2007616
Title :
Effect of substitution on the transport properties of the half-Heusler alloy ZrNiSn
Author :
Ponnambalam, V. ; Pope, A.L. ; Xia, Y. ; Bhattacharya, S. ; Poon, S.J. ; Tritt, T.M.
Author_Institution :
Dept. of Phys., Virginia Univ., Charlottesville, VA, USA
fYear :
1999
fDate :
Aug. 29 1999-Sept. 2 1999
Firstpage :
340
Lastpage :
343
Abstract :
Substituted semiconductor alloys exhibit effects due to doping and disorder. To focus on the effect of disorder on transport properties, we have investigated isoelectronic Zr/sub 1-x/Hf/sub x/NiSn (x=0.0-0.3) and heavily substituted Zr/sub 0.5/Hf/sub 0.5/Ni/sub 0.7/Pd/sub 0.3/Sn/sub 0.95/, half Heusler alloys. Upon substitution, Zr/sub 1-x/Hf/sub x/NiSn alloys exhibit resistivity ratios R=/spl rho//sub 4.2K///spl rho//sub 295K/ as large as /spl sim/300 and thermally activated conduction in the temperature range 100-295K. At 4.2K, the (Zr,Hf)NiSn alloys possess carrier densities of /spl sim/10/sup 16/ to 10/sup 18/ cm/sup -3/ and carrier mobilities in the range /spl sim/100-350 cm/sup 2//V-s. The opposite signs exhibited by the Hall coefficient and thermopower, along with the saturation of resistivity at low temperature in ZrNiSn and Zr/sub 0.5/Hf/sub 0.5/Ni/sub 0.7/Pd/sub 0.3/Sn/sub 0.95/ alloys indicate band overlapping. Various scenarios of bandgap structures are discussed.
Keywords :
Hall effect; carrier density; carrier mobility; energy gap; hafnium alloys; nickel alloys; semiconductor materials; thermoelectric power; tin alloys; zirconium alloys; 10 to 295 K; 4.2 K; Hall coefficient; Zr/sub 0.5/Hf/sub 0.5/Ni/sub 0.7/Pd/sub 0.3/Sn/sub 0.95/; band overlapping; bandgap structures; carrier density; carrier mobility; disorder; half-Heusler alloy; resistivity; substituted semiconductor alloys; substitution; thermally activated conduction; thermopower; Charge carrier density; Hafnium; Nickel alloys; Semiconductor device doping; Semiconductor materials; Temperature distribution; Thermal conductivity; Thermal resistance; Tin; Zirconium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermoelectrics, 1999. Eighteenth International Conference on
Conference_Location :
Baltimore, MD, USA
ISSN :
1094-2734
Print_ISBN :
0-7803-5451-6
Type :
conf
DOI :
10.1109/ICT.1999.843399
Filename :
843399
Link To Document :
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