Title :
Average Run Length Performance of Shewhart Control Chart with Interpretation Rules using Markov Chain Approach
Author :
Jamali, Abdul Sattar ; Jinlin, Li ; Chandio, Abdul Fattah
Author_Institution :
Beijing Inst. of Technol., Beijing
fDate :
May 30 2007-June 1 2007
Abstract :
The advantage of a Shewhart X macr control chart is its simplicity and its ability to detect large process average shifts quickly. However, the Shewhart chart, which signals an out-of-control condition when a single point falls beyond a 3-sigma limit, is also known for its insensitivity to small process average shifts. In order to make the Shewhart X macr macr control chart more sensitive for small process average shifts, an additional interpretation rules has been suggested by the practitioners. Therefore, in this paper the average run length (ARL) performance of Shewhart X macr control chart with most interpretation rules used in practice was evaluated using MARKOV chain for normal and gamma distributions through by MATLAB. The results show that the in-control average run length performance (when process is in control) be fairly high for particular rule 3 when underlying data from a gamma distribution rather than normal distribution. It was also observed that the out-of-control average run length performance (when process is out of control) vary greatly from normal to gamma distributions.
Keywords :
Markov processes; control charts; gamma distribution; normal distribution; statistical process control; ARL performance; MATLAB; Markov chain approach; Shewhart control chart; average run length performance; gamma distributions; interpretation rules; manufacturing process; normal distributions; process average shifts; statistical process control; Automatic control; Automation; Conference management; Control charts; Engineering management; Gaussian distribution; Manufacturing processes; Process control; Signal processing; Technology management; Markov chain; Shewhart control chart; average run length; gamma distribution; intrepretation rules; normal distribution;
Conference_Titel :
Control and Automation, 2007. ICCA 2007. IEEE International Conference on
Conference_Location :
Guangzhou
Print_ISBN :
978-1-4244-0818-4
Electronic_ISBN :
978-1-4244-0818-4
DOI :
10.1109/ICCA.2007.4376722