Title :
The impact of test instrumentation with distributed processing capabilities on test program set (TPS) architecture and development
Author :
McGoldrick, Michael
Author_Institution :
Assembly Test Div., Teradyne, Inc., North Reading, MA, USA
Abstract :
Modern digital interconnection methods have placed significant computational demands on computers controlling test systems, and adding dedicated computing resources for high performance digital test instrumentation to the test system can help meet these demands. This paper examines the impact of these additional computing resources on the design of a TPS, and proposes a software framework to assist developers in creating TPSs for multi-computer environments.
Keywords :
digital instrumentation; distributed processing; message passing; multiprocessor interconnection networks; computers controlling test systems; computing resources; digital interconnection methods; distributed processing capabilities; high performance digital test instrumentation; multicomputer environments; software framework; test program set architecture; Computer architecture; Computers; Instruments; Payloads; Servers; Software; Synchronization; IVI; IVI custom specific driver; LVDS; LXI; TPS; clock speeds; digital; instrument driver; inter-process communication; message passing; subTPS; synchronization;
Conference_Titel :
AUTOTESTCON, 2011 IEEE
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-4244-9362-3
DOI :
10.1109/AUTEST.2011.6058742
