• DocumentCode
    2008020
  • Title

    Session MB1: On-Chip Testing of Embedded Silicon Transducers

  • fYear
    2004
  • fDate
    12-15 Sept. 2004
  • Firstpage
    11
  • Lastpage
    11
  • Abstract
    Start of the above-titled section of the conference proceedings record.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOC Conference, 2004. Proceedings. IEEE International
  • Conference_Location
    Santa Clara, CA, USA
  • Print_ISBN
    0-7803-8445-8
  • Type

    conf

  • DOI
    10.1109/SOCC.2004.1362332
  • Filename
    1362332
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2008020