Title :
High temperature electrical transport in Al-Pd-Mn quasicrystals
Author :
Pope, A.L. ; Littleton, R.T., IV ; Jeffries, J. ; Tritt, T.M. ; Feuerbacher, M. ; Gagnon, R. ; Legault, S. ; Strom-Olsen, J.
Author_Institution :
Dept. of Phys. & Astron., South Carolina Univ., Clemson, SC, USA
fDate :
Aug. 29 1999-Sept. 2 1999
Abstract :
We report measurements of the electrical conductivity /spl sigma/(T) and the Seebeck coefficient /spl alpha/(T) of a Czochralski-grown single phase quasicrystal of icosahedral Al/sub 70.8/Pd/sub 20.9/Mn/sub 8.3/ in the temperature range between 5 and 600 K. The electrical conductivity /spl sigma/(T) is only weakly temperature dependent. The values of the conductivity fall in the range between 630 and 740 (/spl Omega/ cm)/sup -1/. The Seebeck coefficient, /spl alpha/(T), increases monotonically with increasing temperature, reaches a maximum of 110 /spl mu/V/K at around 500 K after which the thermopower begins to decrease with increasing temperature. The power factor, /spl alpha//sup 2//spl sigma/T, is obtained from the electrical conductivity and thermopower data and at T=600 K, the power factor of icosahedral Al/sub 70.8/Pd/sub 20.9/Mn/sub 8.3/ reaches 0.5 W/m-K. This indicates that quasiperiodically structured alloys may be promising materials for thermoelectric applications at temperatures above room temperature.
Keywords :
Seebeck effect; aluminium alloys; manganese alloys; palladium alloys; quasicrystals; thermoelectric power; 5 to 600 K; Al-Pd-Mn quasicrystals; Al/sub 70.8/Pd/sub 20.9/Mn/sub 8.3/; Seebeck coefficient; electrical conductivity; high temperature electrical transport; quasiperiodically structured alloys; thermoelectric applications; thermopower; Application software; Conducting materials; Crystalline materials; Electrons; Lattices; Phonons; Temperature dependence; Temperature distribution; Thermal conductivity; Thermoelectricity;
Conference_Titel :
Thermoelectrics, 1999. Eighteenth International Conference on
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
0-7803-5451-6
DOI :
10.1109/ICT.1999.843419