Title :
Supporting a family of test program languages using a single open markup language
Author :
Wegener, Steven A.
Author_Institution :
Boeing Co., St. Louis, MO, USA
Abstract :
Having a single structure for representing test program data is the cornerstone for a common architecture of a modular system that includes test program development, test program data collection, test program execution, collection of runtime data and interaction with intelligent sequencers. A common open markup language leads to common tools for data collection, test program editing, and a common runtime engine. Boeing has a fielded, open and scalable format currently supporting a single test program language. This paper will examine the use of this structure for storing other test program languages and how it fits into a common architecture approach. Presented is the concept of a simplified notation for automated test system programs (SNAP) that is human-readable yet easily converted to machine-readable extensible markup language (XML).
Keywords :
XML; program testing; Boeing; machine readable extensible markup language; runtime data collection; runtime engine; simplified notation for automated test system programs; single open markup language; test program data collection; test program development; test program editing; test program execution; test program languages; Context; Data structures; Instruments; Libraries; Runtime; Software; XML; ARCHITECTURE; COMMON; IEEE-1641; LANGUAGE; OPEN; SNAP; TPML; TPS; XML;
Conference_Titel :
AUTOTESTCON, 2011 IEEE
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-4244-9362-3
DOI :
10.1109/AUTEST.2011.6058753