DocumentCode :
2008051
Title :
Proactive network maintenance using machine learning
Author :
Sasisekharan, R. ; Seshadri, Vivek ; Weiss, S.M.
Author_Institution :
AT&T Bell Labs., Middletown, NJ, USA
fYear :
1993
fDate :
29 Nov-2 Dec 1993
Firstpage :
217
Abstract :
We describe a new approach to preactively maintain a massively interconnected communications networks over time. We have applied this approach to the detection and prediction of chronic transmission faults in AT&T´s digital communications network. A windowing technique was applied to large volumes of diagnostic data and these data were analyzed by machine learning methods. A set of conditions has been found that is highly predictive of chronic circuit problems, that is, problems that are likely to continue in the immediate future without diagnosis and repair. In addition, a few conditions have been found that are predictive of problems that affect multiple circuits. Such analyses over the complete network can be helpful in proactively maintaining the network and in spotting trends for circuit problems. Proactive maintenance of the network can help in greatly improving the quality and reliability of a network by identifying potentially serious problems before they degrade
Keywords :
learning (artificial intelligence); reliability; telecommunication network management; telecommunications computing; AT&T; chronic transmission faults detection; diagnostic data; digital communications network; machine learning; massively interconnected communications networks; network quality; network reliability; proactive network maintenance; windowing technique; Circuit faults; Communication networks; Data analysis; Digital communication; Electrical fault detection; Fault detection; Integrated circuit interconnections; Learning systems; Machine learning; Maintenance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Global Telecommunications Conference, 1993, including a Communications Theory Mini-Conference. Technical Program Conference Record, IEEE in Houston. GLOBECOM '93., IEEE
Conference_Location :
Houston, TX
Print_ISBN :
0-7803-0917-0
Type :
conf
DOI :
10.1109/GLOCOM.1993.318126
Filename :
318126
Link To Document :
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